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Ess-neofab

A line- and system-level record of ESS and secondary-battery manufacturing processes

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  • 한국어
  • English
  • Home
  • Process
  • System
  • Interface
  • Traceability
  • News & Trends
  • About
  • Contact

카테고리

  • Interface (28)
  • News & Trends (20)
  • Process (32)
  • System (31)
  • Traceability (22)

최근 글

  • Five million ACC cells equal 2.7 to 3.6 months of nameplate outputOctober 15, 2026
  • A 160 MW battery’s six-week commissioning has two baselinesOctober 8, 2026
  • Two Cycles a Day Take 106.8 % of a Day, and the Retention Tier Shifts Cell Volume by 1.47 GWhOctober 1, 2026
  • Battwoo’s Second-Life EV Batteries — When an 80 % Acceptance Threshold Overlaps the Retirement Distribution, Incoming Screening Becomes the BottleneckSeptember 30, 2026
  • US storage set an energy record in Q2 as installed power fell 7%September 29, 2026
  • CATL Starts Trial Production in Debrecen — The Digits of the Defect-Rate Target, Not the Equipment, Set the Length of a Trial RunSeptember 29, 2026
  • AI 비전검사 게이트 라인 인터페이스 도식
    Interface,  Process

    Embedding an AI Vision Inspection Gate in the Line: Redefining OEE and Takt-Time Design Variables

    August 22, 2026 /

    Across battery-line procurement specifications from 2024 to 2026, a trend is confirmed in which the Cognex, Keyence, ISRA, and MVTec deep-learning vision-inspection platforms have effectively become standard fixtures. However, only inspection-accuracy specs are typically stated, while the effect an AI vision-inspection gate has on the line's overall OEE performance rate and takt-time variance is often not treated as a separate design item. This article redefines the AI vision-inspection gate as two interface variables — judgment delay and reject-merge point — and addresses the procedure for incorporating them into line-balancing calculations. To state the conclusion first, it is not the accuracy of the AI vision inspection itself, but the buffer-capacity design…

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    Between the Continuous Solid-Electrolyte Process and the Assembly Line: How Should the Buffer Interface Be Designed?

    August 31, 2026
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