Process
This category analyzes the systemic impact of upstream process outcomes on downstream processes, going beyond the performance of individual unit equipment.
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Electrode Roll Genealogy: How Key Reissue at Slitting and Stacking Shrinks Defect Isolation from 1,500 Cells to 2
When traceability resolution in the electrode R2R section stops at the "roll ID," a 5,000 mm coating defect in one mother roll expands the isolation scope to every cell derived from that mother roll. Assuming a 3,000,000 mm mother roll, 4 lanes, 8 daughter rolls, and 8,000 mm of cathode web per cell, the isolation scope is 1,500 cells at mother-roll-ID resolution, 188 cells at daughter-roll-ID resolution, and 2 cells at encoder-based mm-coordinate resolution (±500 mm), a difference of up to 750 times. This resolution is preserved only when a key consisting of "parent ID + parent coordinate interval + direction bit + transform coefficient" is reissued at every split…
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Cell-ID Laser DPM Read Rate 99.5% vs 99.95%: How No-Reads Drive Exceptions per Shift and OEE
The read rate of a cell-ID direct part mark (DPM) is a probability defined at a single read point, but the line experiences it raised to the power of the number of read points each cell passes. Assuming 12 read points and 22,000 cells per shift, a 99.5% read rate generates 1,320 No-Read exceptions per shift, while 99.95% generates 132. Under the same assumptions, OEE falls from a baseline of 84.64% to 75.50% at 99.5% (−9.14 pp), but only to 84.13% at 99.95% (−0.51 pp). A DPM specification should therefore be defined not as "read rate X%" but by three items: verification grade immediately after marking (ISO/IEC 29158), allowable exceptions…





